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Test probe: high current; 50A; Ø: 4mm; beryllium copper; 3N; 10mΩ
| Manufacturer |
EQUIP-TEST |
| Type of test probe |
high current |
| Current rating |
50A |
| Tip diameter |
4mm |
| Contact material |
beryllium copper |
| Blade tip shape |
head CG |
| Spring compression force |
3N |
| Contact plating |
gold-plated |
| Operational spring compression |
4.4mm |
| Maksimum spring compression |
5.5mm |
| Max. contact resistance: |
10mΩ |
| Overall length |
38.5mm |
| Minimum pitch |
5.08mm |
| Operating temperature |
-40...250°C |